mmpp: Various Similarity and Distance Metrics for Marked Point
Processes
Compute similarities and distances between marked point processes.
| Version: | 
0.6 | 
| Published: | 
2017-09-29 | 
| DOI: | 
10.32614/CRAN.package.mmpp | 
| Author: | 
Hideitsu Hino, Ken Takano, Yuki Yoshikawa, and Noboru Murata | 
| Maintainer: | 
Hideitsu Hino  <hinohide at cs.tsukuba.ac.jp> | 
| License: | 
GPL-2 | 
| NeedsCompilation: | 
no | 
| Materials: | 
NEWS  | 
| CRAN checks: | 
mmpp results | 
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